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图片 型号 库存 价格 数量 规格书 系列 封装/外壳 包装 产品状态 逻辑类型 电源电压 位数 工作温度 等级 认证 安装类型 供应商设备封装
74GTLP2034DGGRE4

74GTLP2034DGGRE4

IC 8BIT REGIST TXRX 48-TSSOP

Texas Instruments

2,688
74GTLP2034DGGRE4

规格书

74GTLP 48-TFSOP (0.240", 6.10mm Width) Tape & Reel (TR) Obsolete LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver 3.15V ~ 3.45V 8 -40°C ~ 85°C - - Surface Mount 48-TSSOP
74GTLP22034DGGRE4

74GTLP22034DGGRE4

IC 8BIT REGISTER TXRX 48-TSSOP

Texas Instruments

3,060
74GTLP22034DGGRE4

规格书

74GTLP 48-TFSOP (0.240", 6.10mm Width) Tape & Reel (TR) Obsolete LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver 3.15V ~ 3.45V 8 -40°C ~ 85°C - - Surface Mount 48-TSSOP
SN74S1053DBR

SN74S1053DBR

IC 16BIT BUS TERM ARRAY 20SSOP

Texas Instruments

1,014
SN74S1053DBR

规格书

74S 20-SSOP (0.209", 5.30mm Width) Tape & Reel (TR) Active Schottky Barrier Diode Bus-Termination Array - 16 0°C ~ 70°C - - Surface Mount 20-SSOP
74LVTH182504APMG4

74LVTH182504APMG4

IC 20BIT UNIV BUS TXRX 64-LQFP

Texas Instruments

1,356
74LVTH182504APMG4

规格书

74LVTH 64-LQFP Tray Discontinued at Digi-Key ABT Scan Test Device With Universal Bus Transceivers 2.7V ~ 3.6V 20 -40°C ~ 85°C - - Surface Mount 64-LQFP (10x10)
SN74BCT8374ADWR

SN74BCT8374ADWR

IC SCAN TEST DEVICE W/FF 24-SOIC

Texas Instruments

1,862
SN74BCT8374ADWR

规格书

74BCT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with D-Type Edge-Triggered Flip-Flops 4.5V ~ 5.5V 8 0°C ~ 70°C - - Surface Mount 24-SOIC
SN74BCT8240ADWRG4

SN74BCT8240ADWRG4

IC SCAN TEST DEVICE 24SOIC

Texas Instruments

2,467
SN74BCT8240ADWRG4

规格书

74BCT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Inverting Buffers 4.5V ~ 5.5V 8 0°C ~ 70°C - - Surface Mount 24-SOIC
SN74BCT8373ADWRG4

SN74BCT8373ADWRG4

IC SCAN TEST DEVICE 24SOIC

Texas Instruments

1,749
SN74BCT8373ADWRG4

规格书

74BCT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with D-Type Latches 4.5V ~ 5.5V 8 0°C ~ 70°C - - Surface Mount 24-SOIC
SN74BCT8374ADWRG4

SN74BCT8374ADWRG4

IC SCAN TEST DEVICE 24SOIC

Texas Instruments

4,346
SN74BCT8374ADWRG4

规格书

74BCT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with D-Type Edge-Triggered Flip-Flops 4.5V ~ 5.5V 8 0°C ~ 70°C - - Surface Mount 24-SOIC
SN74ABT8543DWR

SN74ABT8543DWR

IC SCAN TEST DEVICE 28-SOIC

Texas Instruments

3,484
SN74ABT8543DWR

规格书

74ABT 28-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Registered Bus Transceiver 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
SN74ABT8646DWR

SN74ABT8646DWR

IC SCAN TEST DEVICE 28-SOIC

Texas Instruments

3,382
SN74ABT8646DWR

规格书

74ABT 28-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
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