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图片 型号 库存 价格 数量 规格书 系列 封装/外壳 包装 产品状态 逻辑类型 电源电压 位数 工作温度 等级 认证 安装类型 供应商设备封装
SN74LVTH18504APMR

SN74LVTH18504APMR

IC 20BIT SCAN TST DEV UBT 64LQFP

Texas Instruments

2,165
SN74LVTH18504APMR

规格书

74LVTH 64-LQFP Tape & Reel (TR) Active ABT Scan Test Device With Universal Bus Transceivers 2.7V ~ 3.6V 20 -40°C ~ 85°C - - Surface Mount 64-LQFP (10x10)
SN74LVTH182502APMR

SN74LVTH182502APMR

IC SCAN-TEST-DEV/TRANSCVR 64LQFP

Texas Instruments

2,048
SN74LVTH182502APMR

规格书

74LVTH 64-LQFP Tape & Reel (TR) Active ABT Scan Test Device With Universal Bus Transceivers 2.7V ~ 3.6V 18 -40°C ~ 85°C - - Surface Mount 64-LQFP (10x10)
SN74ABTH16460DLR

SN74ABTH16460DLR

IC REGISTERED TRANSCVR 56SSOP

Texas Instruments

4,004
SN74ABTH16460DLR

规格书

74ABTH 56-BSSOP (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete 4-TO-1 Multiplexed/Demultiplexed Transceivers 4.75V ~ 5.5V 5 -40°C ~ 85°C - - Surface Mount 56-SSOP
SN74LVT8980ADWR

SN74LVT8980ADWR

IC TEST-BUS CONTROLLER 24-SOIC

Texas Instruments

4,528
SN74LVT8980ADWR

规格书

74LVT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Active Embedded Test-Bus Controllers 2.7V ~ 3.6V 8 -40°C ~ 85°C - - Surface Mount 24-SOIC
SN74SSTU32864DZKER

SN74SSTU32864DZKER

IC 25BIT CONFIG REG BUFF 96-BGA

Texas Instruments

634
SN74SSTU32864DZKER

规格书

- 96-LFBGA Tape & Reel (TR) Obsolete 1:1, 1:2 Configurable Registered Buffer 1.7V ~ 1.9V 25, 14 0°C ~ 70°C - - Surface Mount 96-PBGA MICROSTAR (13.6x5.6)
SN74SSTV32852ZKFR

SN74SSTV32852ZKFR

IC BUFFER 24BIT-48BIT 114BGA

Texas Instruments

1,627
SN74SSTV32852ZKFR

规格书

74SSTV 114-LFBGA Tape & Reel (TR) Obsolete Registered Buffer with SSTL_2 Compatible I/O for DDR 2.3V ~ 2.7V 24, 48 0°C ~ 70°C - - Surface Mount 114-BGA MICROSTAR (16x5.5)
SN74ABT18640DL

SN74ABT18640DL

IC SCAN-TEST-DEV/TXRX 56-SSOP

Texas Instruments

1,552
SN74ABT18640DL

规格书

74ABT 56-BSSOP (0.295", 7.50mm Width) Bulk Active Scan Test Device with Inverting Bus Transceivers 4.5V ~ 5.5V 18 -40°C ~ 85°C - - Surface Mount 56-SSOP
SN74ABT8652DW

SN74ABT8652DW

IC SCAN TEST DEVICE 28-SOIC

Texas Instruments

1,881
SN74ABT8652DW

规格书

74ABT 28-SOIC (0.295", 7.50mm Width) Bulk Active Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
SN74ABT8652DL

SN74ABT8652DL

IC SCAN-TEST-DEV/XCVR 28-SSOP

Texas Instruments

3,747
SN74ABT8652DL

规格书

74ABT 28-BSSOP (0.295", 7.50mm Width) Bulk Active Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-BSSOP
SN74BCT8245ADW

SN74BCT8245ADW

IC SCAN TEST DEVICE TXRX 24-SOIC

Texas Instruments

4,094
SN74BCT8245ADW

规格书

74BCT 24-SOIC (0.295", 7.50mm Width) Bulk Obsolete Scan Test Device with Bus Transceivers 4.5V ~ 5.5V 8 0°C ~ 70°C - - Surface Mount 24-SOIC
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